PRICES include / exclude VAT
in stockReleased: 2012-06-01
UNE EN 62047-14:2012
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
Dispositivos semiconductores. Dispositivos microelectromecánicos. Parte 14: Método de medición del límite de formación de los materiales de película metálica. (Ratificada por AENOR en junio de 2012.)
Format
Availability
Price and currency
English PDF
Immediate download
77.00 USD
English Hardcopy
In stock
77.00 USD
| Standard number: | UNE EN 62047-14:2012 |
| Pages: | 21 |
| Released: | 2012-06-01 |
DESCRIPTION
This standard UNE EN 62047-14:2012 Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.) is classified in these ICS categories:
- 31.080.99