PRICES include / exclude VAT
in stockReleased: 2007-01-01
UNE EN 62047-2:2006
Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
Dispositivos semiconductores. Parte 2: Dispositivos micro-electromecánicos. Métodos de ensayo de tensión de materiales de película fina (IEC 62047-2:2006). (Ratificada por AENOR en enero de 2007.)
Format
Availability
Price and currency
English PDF
Immediate download
72.11 USD
English Hardcopy
In stock
72.11 USD
| Standard number: | UNE EN 62047-2:2006 |
| Pages: | 17 |
| Released: | 2007-01-01 |
DESCRIPTION
This standard UNE EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.) is classified in these ICS categories:
- 31.080.99