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in stockReleased: 2007-01-01
UNE EN 62047-2:2006
Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
Dispositivos semiconductores. Parte 2: Dispositivos micro-electromecánicos. Métodos de ensayo de tensión de materiales de película fina (IEC 62047-2:2006). (Ratificada por AENOR en enero de 2007.)
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| Standard number: | UNE EN 62047-2:2006 |
| Pages: | 17 |
| Released: | 2007-01-01 |
| Status: | Standard |
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