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Homepage>UNE standards>UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
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in stockReleased: 2014-11-01
UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)

UNE EN 62047-22:2014

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)

Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 22: Métodos de ensayo de tensión electromecánica para películas delgadas conductoras sobre sustratos flexibles (Ratificada por AENOR en noviembre de 2014.)

CURRENCY
LANGUAGE
English
Standard number:UNE EN 62047-22:2014
Pages:14
Released:2014-11-01
DESCRIPTION
This standard UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.) is classified in these ICS categories:
  • 01.080.99
  • 31.080.99
This product includes: