PRICES include / exclude VAT
in stockReleased: 2011-09-01
UNE EN 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 8: Métodos de ensayo de curvado en banda la medida de propiedades de tensión de las películas finas(Ratificada por AENOR en septiembre de 2011.)
Format
Availability
Price and currency
English PDF
Immediate download
78.22 USD
English Hardcopy
In stock
78.22 USD
| Standard number: | UNE EN 62047-8:2011 |
| Pages: | 21 |
| Released: | 2011-09-01 |
DESCRIPTION
This standard UNE EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.) is classified in these ICS categories:
- 31.080.99