PRICES include / exclude VAT
in stockReleased: 2010-09-01
UNE EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
Dispositivos de semiconductores. Ensayo de electromigración de intensidad constante. (Ratificada por AENOR en septiembre de 2010.)
Format
Availability
Price and currency
English PDF
Immediate download
Printable
59.40 EUR
English Hardcopy
In stock
59.40 EUR
| Standard number: | UNE EN 62415:2010 |
| Pages: | 14 |
| Released: | 2010-09-01 |
| Status: | Standard |
DESCRIPTION