The objective of this standard is to provide a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Immunity Model Conducted Immunity, ICIM-CI. It is intended to be used for predicting the immunity levels to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This document has two main parts: " the first is the electrical description of ICIM-CI macro-model elements, " the second part proposes a universal data exchange format called CIML based on XML. This format allows encoding the ICIM-CI in a more useable and generic form for immunity simulation.