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Homepage>ICS codes>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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37 results
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UNE 21321:1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Released: 1978-06-15
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UNE EN 160000/A1:1995
GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS (Endorsed by AENOR in November of 1996.)
Released: 1996-11-01
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18.34 USD
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UNE EN 160000:1993
GS: MODULAR ELECTRONIC UNITS. (Endorsed by AENOR in September of 1996.)
Released: 1996-09-01
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UNE EN 61086-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
Released: 2004-07-30
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66.00 USD
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66.00 USD
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55.00 USD
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UNE EN 61086-3-1:2004
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
Released: 2004-07-23
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68.45 USD
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UNE EN 61943:1999
INTEGRATED CIRCUITS. MANUFACTURING LINE APPROVAL APPLICATION GUIDELINE (Endorsed by AENOR in November of 1999.)
Released: 1999-11-01
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UNE EN 61964:1999
Integrated circuits - Memory devices pin configurations. (Endorsed by AENOR in April of 2001.)
Released: 2001-04-01
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UNE EN 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kKHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in November of 2002.)
Released: 2002-11-01
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UNE EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by AENOR in April of 2006.)
Released: 2006-04-01
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42.78 USD
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UNE EN 61967-4:2002/AC:2017-07
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
Released: 2017-09-01
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UNE EN 61967-5:2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method (Endorsed by AENOR in July of 2003.)
Released: 2003-07-01
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UNE EN 61967-6:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
Released: 2002-11-01
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37 results
134Last page