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Main page>UNE standards>UNE EN IEC 61967-4:2021 - Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method
in stockReleased: 2021-06-01
UNE EN IEC 61967-4:2021 - Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method

UNE EN IEC 61967-4:2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method

Circuitos integrados. Mediciones de las emisiones electromagnéticas. Parte 4 Mediciones de emisiones conducidas, método de acoplamiento directo 1 ohm/150 ohm. (Ratificada por la Asociación Española de Normalización en junio de 2021.)

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Standard number:UNE EN IEC 61967-4:2021
Pages:52
Released:2021-06-01
Status:Standard
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UNE EN IEC 61967-4:2021

This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 © resistive probe and RF voltage measurement using a 150 © coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.

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UNE standards
31.200 Integrated circuits. Microelectronics
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