PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
Sponsored link
in stockReleased: 2002-11-01
UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

UNE EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas de 150 kHz a 1 GHz. Parte 6: Mediciones de emisiones conducidas. Método de sonda magnética. (Ratificada por AENOR en noviembre de 2002)

Format
Availability
Price and currency
English PDF
Immediate download
85.56 USD
English Hardcopy
In stock
85.56 USD
Standard number:UNE EN 61967-6:2002
Pages:30
Released:2002-11-01
DESCRIPTION

This standard UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.) is classified in these ICS categories:

  • 31.200