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Homepage>UNE standards>UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
in stockReleased: 2022-07-01
UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

UNE EN IEC 60749-10:2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 10: Choque mecánico. Dispositivo y submontaje. (Ratificada por la Asociación Española de Normalización en julio de 2022.)

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Standard number:UNE EN IEC 60749-10:2022
Pages:20
Released:2022-07-01
Status:Standard
DESCRIPTION

This standard UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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