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in stockReleased: 2026-03-01
UNE EN IEC 60749-23:2026
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Española de Normalización in March of 2026.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura. (Ratificada por la Asociación Española de Normalización en marzo de 2026.)
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| Standard number: | UNE EN IEC 60749-23:2026 |
| Pages: | 17 |
| Released: | 2026-03-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN IEC 60749-23:2026 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Española de Normalización in March of 2026.) is classified in these ICS categories:
- 31.080.01