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in stockReleased: 2025-09-01
UNE EN IEC 60749-34-1:2025
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module (Endorsed by Asociación Española de Normalización in September of 2025.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 34-1: Ensayo de ciclos de potencia para módulos semiconductores de potencia. (Ratificada por la Asociación Española de Normalización en septiembre de 2025.)
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| Standard number: | UNE EN IEC 60749-34-1:2025 |
| Pages: | 37 |
| Released: | 2025-09-01 |
| Status: | Standard |
DESCRIPTION
UNE EN IEC 60749-34-1:2025
This part of IEC IEC 60749 describes a test method that is used to determine the capability of power semiconductor modules to withstand thermal and mechanical stress resulting from cycling the power dissipation of the internal semiconductors and the internal connectors. It is based on IEC 60749-34, Power cycling, but is developed specifically for silicon-based power semiconductor module products. This test causes wear-out and is considered destructive.