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UNE EN IEC 61189-2-805:2024
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-805: X/Y CTE test for thin base materials by TMA (Endorsed by Asociación Española de Normalización in July of 2024.)
Métodos de ensayo para materiales eléctricos, tarjetas impresas y otras estructuras y montajes de interconexión. Parte 2-805: Ensayo X/Y CTE para materiales de base delgada por TMA (Ratificada por la Asociación Española de Normalización en julio de 2024.)
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| Standard number: | UNE EN IEC 61189-2-805:2024 |
| Pages: | 18 |
| Released: | 2024-07-01 |
| Status: | Standard |
DESCRIPTION
UNE EN IEC 61189-2-805:2024
This part of IEC 61189 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.