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>UNE EN IEC 62132-8:2026 - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by Asociación Española de Normalización in May of 2026.)
Released: 2026-05-01
UNE EN IEC 62132-8:2026 - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by Asociación Española de Normalización in May of 2026.)

UNE EN IEC 62132-8:2026

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by Asociación Española de Normalización in May of 2026.)

Circuitos integrados. Medición de la inmunidad electromagnética. Parte 8: Medición de la inmunidad radiada. Método de la línea TEM de placas con circuito integrado (IC) (Ratificada por la Asociación Española de Normalización en mayo de 2026.)

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Standard number:UNE EN IEC 62132-8:2026
Released:2026-05-01
Status:Standard
Pages (English):47
DESCRIPTION

UNE EN IEC 62132-8:2026

This part of IEC 62132 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances using an IC stripline.

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