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>UNE standards>UNE EN IEC 62276:2025 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)
in stockReleased: 2025-06-01
UNE EN IEC 62276:2025 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)

UNE EN IEC 62276:2025

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)

Obleas monocristalinas para aplicaciones de dispositivos de ondas acústicas de superficie (OAS). Especificaciones y métodos de medida. (Ratificada por la Asociación Española de Normalización en junio de 2025.)

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Standard number:UNE EN IEC 62276:2025
Pages:50
Released:2025-06-01
Status:Standard
DESCRIPTION

UNE EN IEC 62276:2025

This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.