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>UNE standards>UNE EN IEC 63251:2023 - Test method for mechanical properties of flexible opto-electric circuit boards under thermal stress (Endorsed by Asociación Española de Normalización in January of 2024.)
in stockReleased: 2024-01-01
UNE EN IEC 63251:2023 - Test method for mechanical properties of flexible opto-electric circuit boards under thermal stress (Endorsed by Asociación Española de Normalización in January of 2024.)

UNE EN IEC 63251:2023

Test method for mechanical properties of flexible opto-electric circuit boards under thermal stress (Endorsed by Asociación Española de Normalización in January of 2024.)

Método de ensayo para determinar las propiedades mecánicas de placas de circuito optoeléctricas flexibles sometidas a estrés térmico (Ratificada por la Asociación Española de Normalización en enero de 2024.)

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Standard number:UNE EN IEC 63251:2023
Pages:30
Released:2024-01-01
Status:Standard
DESCRIPTION

UNE EN IEC 63251:2023

This International Standard defines the thermal endurance test methods for reliability assessment of flexible opto-electric circuit boards. The purpose of this standard is to accommodate the uniform thermal characteristics required by the flexible opto-electric circuit in high temperature environments such as automobiles. In particular, this standard specifies a test method to inspect the occurrence of color exchange, deformation and delamination of flexible opto-electric circuit boards under thermal stress.