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>UNE standards>UNE EN IEC 63364-1:2023 - Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
in stockReleased: 2023-03-01
UNE EN IEC 63364-1:2023 - Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)

UNE EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)

Dispositivos semiconductores. Dispositivos semiconductores para el sistema IOT. Parte 1: Método de ensayo de detección de variación acústica. (Ratificada por la Asociación Española de Normalización en marzo de 2023.)

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Standard number:UNE EN IEC 63364-1:2023
Pages:20
Released:2023-03-01
Status:Standard
DESCRIPTION

UNE EN IEC 63364-1:2023

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.