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Homepage>UNE standards>UNE EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
in stockReleased: 2023-03-01
UNE EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)

UNE EN IEC 63364-1:2023

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)

Dispositivos semiconductores. Dispositivos semiconductores para el sistema IOT. Parte 1: Método de ensayo de detección de variación acústica. (Ratificada por la Asociación Española de Normalización en marzo de 2023.)

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Standard number:UNE EN IEC 63364-1:2023
Pages:20
Released:2023-03-01
DESCRIPTION

This standard UNE EN IEC 63364-1:2023 Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.) is classified in these ICS categories:

  • 31.080.99