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immediate downloadReleased: 2024-01-15
24/30465997 DC
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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Standard number: | 24/30465997 DC |
Pages: | 34 |
Released: | 2024-01-15 |
Status: | Draft for Comment |
DESCRIPTION
24/30465997 DC
This standard 24/30465997 DC Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary is classified in these ICS categories:
- 01.040.37 Image technology (Vocabularies)
- 01.040.71 Chemical technology (Vocabularies)
- 71.040.50 Physicochemical methods of analysis