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immediate downloadReleased: 2024-08-16
24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
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Standard number: | 24/30499009 DC |
Pages: | 31 |
Released: | 2024-08-16 |
Status: | Draft for Comment |
DESCRIPTION
24/30499009 DC
This standard 24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
- 31.080.99 Other semiconductor devices