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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>24/30506674 DC BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment
immediate downloadReleased: 2024-12-13
24/30506674 DC BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment

24/30506674 DC

BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment

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Standard number:24/30506674 DC
Pages:16
Released:2024-12-13
Status:Draft for Comment
Pages (English):16
DESCRIPTION

24/30506674 DC


This standard 24/30506674 DC BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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