Log inSign up
LANGUAGE en
Menu
STOREMembershipHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>26/30564419 DC BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
immediate downloadReleased: 2026-05-29

26/30564419 DC

BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR

Format
Availability
Price and currency
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
27.06 USD
English Hardcopy
In stock
27.06 USD
Standard number:26/30564419 DC
Pages:28
Released:2026-05-29
Status:Draft for Comment
DESCRIPTION

26/30564419 DC


This standard 26/30564419 DC BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

Print