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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
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immediate downloadReleased: 2011-03-31
BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)

BS EN 60749-32:2003+A1:2010

Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)

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Standard number:BS EN 60749-32:2003+A1:2010
Pages:8
Released:2011-03-31
ISBN:978 0 580 68754 9
Status:Standard
DESCRIPTION

BS EN 60749-32:2003+A1:2010


This standard BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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