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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-33:2004 Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
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immediate downloadReleased: 2004-06-22
BS EN 60749-33:2004 Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

BS EN 60749-33:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

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Standard number:BS EN 60749-33:2004
Pages:10
Released:2004-06-22
ISBN:0 580 43973 9
Status:Standard
DESCRIPTION

BS EN 60749-33:2004


This standard BS EN 60749-33:2004 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.