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Main page>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
immediate downloadReleased: 2003-06-19
BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

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Standard number:BS EN 60749-36:2003
Pages:8
Released:2003-06-19
ISBN:0 580 42065 5
Status:Standard
DESCRIPTION

BS EN 60749-36:2003


This standard BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
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