PRICES include / exclude VAT
Sponsored link
immediate downloadReleased: 2014-10-31
BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Format
Availability
Price and currency
English Secure PDF
Immediate download
163.80 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
16.38 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
49.14 USD
English Hardcopy
In stock
163.80 USD
| Standard number: | BS EN 60749-42:2014 |
| Pages: | 12 |
| Released: | 2014-10-31 |
| ISBN: | 978 0 580 79091 1 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-42:2014
This standard BS EN 60749-42:2014 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60749 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments.
This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.