PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 62415:2010 Semiconductor devices. Constant current electromigration test
Sponsored link
immediate downloadReleased: 2010-07-31
BS EN 62415:2010 Semiconductor devices. Constant current electromigration test

BS EN 62415:2010

Semiconductor devices. Constant current electromigration test

Format
Availability
Price and currency
English Secure PDF
Immediate download
163.80 USD
English Hardcopy
In stock
163.80 USD
Standard number:BS EN 62415:2010
Pages:14
Released:2010-07-31
ISBN:978 0 580 61882 6
Status:Standard
DESCRIPTION

BS EN 62415:2010


This standard BS EN 62415:2010 Semiconductor devices. Constant current electromigration test is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.