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immediate downloadReleased: 2022-08-16
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
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Standard number: | BS EN IEC 60749-10:2022 |
Pages: | 16 |
Released: | 2022-08-16 |
ISBN: | 978 0 539 17345 1 |
Status: | Standard |
DESCRIPTION
BS EN IEC 60749-10:2022
This standard BS EN IEC 60749-10:2022 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
- covers both unattached components and components attached to printed wiring boards;
- tolerance limits modified for peak acceleration and pulse duration;
- mathematical formulae added for velocity change and equivalent drop height.