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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN IEC 60749-37:2022 Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
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BS EN IEC 60749-37:2022 Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer

BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer

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Standard number:BS EN IEC 60749-37:2022
Pages:28
Released:2022-11-22
ISBN:978 0 539 15199 2
Status:Standard
DESCRIPTION

BS EN IEC 60749-37:2022


This standard BS EN IEC 60749-37:2022 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
IEC 60749-37:2022 is available as IEC 60749-37:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-37:2022 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test. This edition includes the following significant technical changes with respect to the previous edition: - correction of a previous technical error concerning test conditions; - updates to reflect improvements in technology.