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immediate downloadReleased: 2024-02-09
BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
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Standard number: | BS EN IEC 60749-5:2024 - TC |
Pages: | 34 |
Released: | 2024-02-09 |
ISBN: | 978 0 539 30521 0 |
Status: | Tracked Changes |
DESCRIPTION
BS EN IEC 60749-5:2024 - TC
This standard BS EN IEC 60749-5:2024 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) The specification of the test equipment is changed to require the need to minimize relative humidity gradients and maximize air flow between semiconductor devices under test; b) The specification of the test equipment fixtures is changed to require the avoidance of condensation on devices under test and on electrical fixtures connecting the devices to the test equipment; c) replacement of references to “virtual junction” with “die”.