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immediate downloadReleased: 2021-09-08
BS IEC 62899-503-3:2021
Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
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| Standard number: | BS IEC 62899-503-3:2021 |
| Pages: | 16 |
| Released: | 2021-09-08 |
| ISBN: | 978 0 539 04325 9 |
| Status: | Standard |
DESCRIPTION
BS IEC 62899-503-3:2021
This standard BS IEC 62899-503-3:2021 Printed electronics is classified in these ICS categories:
- 31.080.30 Transistors
- 29.045 Semiconducting materials
- 29.220.10 Primary cells and batteries
- 29.220.30 Alkaline secondary cells and batteries
- 29.220.99 Other cells and batteries
- 91.120.10 Thermal insulation of buildings
- 91.140.10 Central heating systems
This part of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.