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Homepage>BS Standards>29 ELECTRICAL ENGINEERING>29.045 Semiconducting materials>BS IEC 62899-503-3:2021 Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
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BS IEC 62899-503-3:2021 Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

BS IEC 62899-503-3:2021

Printed electronics Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

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Standard number:BS IEC 62899-503-3:2021
Pages:16
Released:2021-09-08
ISBN:978 0 539 04325 9
Status:Standard
DESCRIPTION

BS IEC 62899-503-3:2021


This standard BS IEC 62899-503-3:2021 Printed electronics is classified in these ICS categories:
  • 31.080.30 Transistors
  • 29.045 Semiconducting materials
  • 29.220.10 Primary cells and batteries
  • 29.220.30 Alkaline secondary cells and batteries
  • 29.220.99 Other cells and batteries