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BS ISO 14606:2022 - TC
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-17
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PD ISO/TS 25138:2025
Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Released: 2025-02-24
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348.00 EUR
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25/30483844 DC
BS ISO 24237 Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
BS ISO 24237 Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2025-01-27
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24.00 EUR
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24.00 EUR
PD ISO/TS 15338:2025 - TC
Tracked Changes. Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
Tracked Changes. Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
Released: 2025-03-13
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PD ISO/TS 25138:2025 - TC
Tracked Changes. Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Tracked Changes. Surface chemical analysis. Analysis of metal oxide films by glow discharge optical emission spectrometry
Released: 2025-03-07
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487.20 EUR
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487.20 EUR
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24.00 EUR
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PD ISO/TS 15338:2025
Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures
Released: 2025-03-11
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BS EN 50436-7:2024 - TC
Tracked Changes. Alcohol interlocks. Test methods and performance requirements Installation document
Tracked Changes. Alcohol interlocks. Test methods and performance requirements Installation document
Released: 2024-09-05
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266.40 EUR
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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
Released: 2006-11-30
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309.60 EUR
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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Released: 2013-03-31
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396.00 EUR
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396.00 EUR
BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
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189.60 EUR
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189.60 EUR
BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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189.60 EUR
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189.60 EUR