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71.040.40 Chemical analysis
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BS ISO 19229:2019 - TC
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Released: 2020-02-24
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BS EN ISO 6141:2015+A1:2020
Gas analysis. Contents of certificates for calibration gas mixtures
Gas analysis. Contents of certificates for calibration gas mixtures
Released: 2020-03-10
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53.60 USD
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BS ISO 10810:2019 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Released: 2020-02-24
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2020-02-27
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293.33 USD
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29.33 USD
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88.00 USD
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BS ISO 7504:2015 - TC
Tracked Changes. Gas analysis. Vocabulary
Tracked Changes. Gas analysis. Vocabulary
Released: 2020-02-27
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BS EN ISO 6142-1:2015 - TC
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Tracked Changes. Gas analysis. Preparation of calibration gas mixtures Gravimetric method for Class I mixtures
Released: 2020-02-26
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BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
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21.07 USD
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63.20 USD
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BS EN IEC 61207-2:2019
Expression of performance of gas analyzers Measuring oxygen in gas utilizing high-temperature electrochemical sensors
Expression of performance of gas analyzers Measuring oxygen in gas utilizing high-temperature electrochemical sensors
Released: 2019-09-12
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88.00 USD
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BS ISO 19318:2021 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-10-12
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BS ISO 17862:2022 - TC
Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Tracked Changes. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
Released: 2023-09-29
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