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BS EN ISO 6145-8:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Diffusion method
Released: 2009-02-28
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BS EN ISO 6145-9:2010
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Saturation method
Released: 2011-02-28
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BS ISO 10810:2019 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Released: 2020-02-24
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BS ISO 10810:2019
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Released: 2019-08-23
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BS ISO 11039:2012
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
Released: 2012-02-29
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BS ISO 11505:2012
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2013-01-31
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BS ISO 11775:2015
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
Released: 2015-10-31
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BS ISO 11952:2019
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
Released: 2019-05-31
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BS ISO 12406:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
Released: 2010-11-30
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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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353.60 USD
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