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BS ISO 14167:2018
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
Gas analysis. General quality aspects and metrological traceability of calibration gas mixtures
Released: 2018-11-28
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27.04 USD
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81.12 USD
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270.40 USD
BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
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27.04 USD
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81.12 USD
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270.40 USD
BS ISO 14606:2022 - TC
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Tracked Changes. Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-17
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353.60 USD
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353.60 USD
BS ISO 14606:2022
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Released: 2023-02-15
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2020-02-27
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BS ISO 14701:2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2018-11-05
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81.12 USD
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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
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317.20 USD
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31.72 USD
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95.16 USD
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317.20 USD
BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-06-14
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BS ISO 14707:2021
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-03-12
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19.50 USD
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BS ISO 14975:2000
Surface chemical analysis. Information formats
Surface chemical analysis. Information formats
Released: 2001-05-15
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BS ISO 14976:1998
Surface chemical analysis. Data transfer format
Surface chemical analysis. Data transfer format
Released: 2000-06-15
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377.00 USD
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37.70 USD
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BS ISO 15470:2017
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
Released: 2017-03-31
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58.50 USD
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195.00 USD