PRICES include / exclude VAT
71.040.40 Chemical analysis
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
BS EN 12698-2:2007
Chemical analysis of nitride bonded silicon carbide refractories XRD methods
Chemical analysis of nitride bonded silicon carbide refractories XRD methods
Released: 2007-05-31
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Released: 2017-01-31
English Secure PDF
Immediate download
333.50 EUR
English Hardcopy
In stock
333.50 EUR
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
BS EN 61207-6:2015
Expression of performance of gas analyzers Photometric analyzers
Expression of performance of gas analyzers Photometric analyzers
Released: 2015-01-31
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Released: 2009-02-28
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Released: 1977-11-30
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Released: 2009-06-30
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
English Secure PDF
Immediate download
296.70 EUR
English Hardcopy
In stock
296.70 EUR
BS ISO 24237:2005
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale
Released: 2005-09-11
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR
PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Released: 2007-08-31
English Secure PDF
Immediate download
253.00 EUR
English Hardcopy
In stock
253.00 EUR
BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
English Secure PDF
Immediate download
181.70 EUR
English Hardcopy
In stock
181.70 EUR