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71.040.40 Chemical analysis
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BS EN 50436-3:2016
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Alcohol interlocks. Test methods and performance requirements Guidance for authorities, decision makers, purchasers and users
Released: 2017-01-31
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BS 5443:1977
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Recommendations for a standard layout for methods of chemical analysis by gas chromatography
Released: 1977-11-30
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BS EN 61207-6:2015
Expression of performance of gas analyzers Photometric analyzers
Expression of performance of gas analyzers Photometric analyzers
Released: 2015-01-31
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BS EN ISO 6145-10:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Permeation method
Released: 2009-02-28
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BS ISO 14237:2010
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
Released: 2010-08-31
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BS EN ISO 6145-11:2008
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods Electrochemical generation
Released: 2009-06-30
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BS ISO 14706:2014
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Released: 2014-07-31
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PD ISO/TR 19319:2013
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
Released: 2013-03-31
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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
Released: 2007-08-31
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BS ISO 21270:2004
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Released: 2005-03-31
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