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71.040.40 Chemical analysis
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BS EN 61207-1:2010
Expression of performance of gas analyzers General
Expression of performance of gas analyzers General
Released: 2011-02-28
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BS EN 16785-2:2018
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Bio-based products. Bio-based content Determination of the bio-based content using the material balance method
Released: 2018-04-23
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BS EN 16785-1:2015
Bio-based products. Bio-based content Determination of the bio-based content using the radiocarbon analysis and elemental analysis
Bio-based products. Bio-based content Determination of the bio-based content using the radiocarbon analysis and elemental analysis
Released: 2015-12-31
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BS EN ISO 6144:2006
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Gas analysis. Preparation of calibration gas mixtures. Static volumetric method
Released: 2007-02-28
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PD ISO/TR 16268:2009
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
Released: 2009-11-30
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BS ISO 20341:2003
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials
Released: 2003-08-08
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BS EN ISO 6143:2006
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures
Released: 2007-02-28
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BS ISO 23830:2008
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Released: 2008-12-31
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BS ISO 17560:2014
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
Released: 2014-09-30
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PD ISO/TS 18507:2015
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Released: 2015-07-31
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BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Released: 2015-11-30
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