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71.040.40 Chemical analysis
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BS ISO 24417:2022
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Surface chemical analysis. Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
Released: 2022-10-31
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BS EN 61207-6:2015 - TC
Tracked Changes. Expression of performance of gas analyzers Photometric analyzers
Tracked Changes. Expression of performance of gas analyzers Photometric analyzers
Released: 2020-02-26
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BS ISO 18115-2:2021 - TC
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Tracked Changes. Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
Released: 2022-02-09
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PD ISO/TR 15969:2021 - TC
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Tracked Changes. Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-06-21
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BS ISO 14707:2021 - TC
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Tracked Changes. Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
Released: 2021-06-14
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BS ISO 19230:2020
Gas analysis. Sampling guidelines
Gas analysis. Sampling guidelines
Released: 2020-12-02
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BS ISO 5861:2024
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
Released: 2024-06-13
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24/30481996 DC
BS ISO 11505. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
BS ISO 11505. Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Released: 2024-11-14
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25/30474488 DC
BS ISO 16666 Surface chemical analysis - Total reflection X-ray fluorescence - Principles and general requirements
BS ISO 16666 Surface chemical analysis - Total reflection X-ray fluorescence - Principles and general requirements
Released: 2025-02-17
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BS ISO 22415:2019
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
Released: 2019-05-14
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BS ISO 17974:2002
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis
Released: 2002-11-29
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BS EN 60746-3:2002
Expression of performance of electrochemical analyzers Electrolytic conductivity
Expression of performance of electrochemical analyzers Electrolytic conductivity
Released: 2003-06-10
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