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71.040.40 Chemical analysis
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BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
Released: 2020-02-27
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255.20 EUR
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BS EN IEC 61207-3:2019 - TC
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Tracked Changes. Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
Released: 2020-02-24
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419.92 EUR
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BS ISO 19229:2019 - TC
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Tracked Changes. Gas analysis. Purity analysis and the treatment of purity data
Released: 2020-02-24
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BS EN ISO 6141:2015+A1:2020
Gas analysis. Contents of certificates for calibration gas mixtures
Gas analysis. Contents of certificates for calibration gas mixtures
Released: 2020-03-10
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155.44 EUR
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BS ISO 10810:2019 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
Released: 2020-02-24
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BS ISO 24465:2023
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
Surface chemical analysis. Determination of the minimum detectability of surface plasmon resonance device
Released: 2023-01-26
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183.28 EUR
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BS ISO 18115-1:2023 - TC
Tracked Changes. Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
Tracked Changes. Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
Released: 2023-06-28
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BS ISO 18115-1:2023
Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
Surface chemical analysis. Vocabulary General terms and terms used in spectroscopy
Released: 2023-06-26
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382.80 EUR
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BS ISO 19318:2021 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
Released: 2021-10-12
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