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>BSI Standards >71 CHEMICAL TECHNOLOGY>71.040 Analytical chemistry>71.040.40 Chemical analysis

71.040.40 Chemical analysis

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191 results
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BS ISO 18554:2016
Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Released: 2016-03-31
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BS ISO 23812:2009
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
Released: 2009-05-31
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BS EN ISO 21079-1:2008
Chemical analysis of refractories containing alumina, zirconia and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Apparatus, reagents and dissolution
Released: 2009-04-30
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BS ISO 7504:2015
Gas analysis. Vocabulary
Released: 2015-05-31
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BS EN ISO 21079-2:2008
Chemical analysis of refractories containing alumina, zirconia, and silica. Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) Wet chemical analysis
Released: 2009-04-30
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BS EN 12698-1:2007
Chemical analysis of nitride bonded silicon carbide refractories Chemical methods
Released: 2007-04-30
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BS 6337-1:1983
General methods of chemical analysis Method for determination of traces of sulphur compounds by reduction and titrimetry
Released: 1983-01-31
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BS ISO 16531:2020
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
Released: 2020-10-06
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BS ISO 12963:2017+A1:2020
Gas analysis. Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
Released: 2021-01-08
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PD ISO/TR 15969:2021
Surface chemical analysis. Depth profiling. Measurement of sputtered depth
Released: 2021-03-26
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BS ISO 22581:2021
Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
Released: 2021-03-19
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BS ISO 13095:2014
Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
Released: 2014-08-31
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191 results
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