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Homepage>CSN Standards>35 ELECTRICAL ENGINEERING>3587 Semiconductor elements>CSN EN 60749-4 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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Released: 01.10.2017
CSN EN 60749-4 ed. 2 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

CSN EN 60749-4 ed. 2

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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Number of Standard:CSN EN 60749-4 ed. 2
Category:358799
Pages:20
Released:01.10.2017
Catalog number:503482
DESCRIPTION

CSN EN 60749-4 ed. 2

CSN EN 60749-4 ed. 2 Tato norma poskytuje velmi zrychlenou teplotní a vlhkostní zkoušku namáháním (HAST) za účelem vyhodnocení spolehlivosti nehermeticky zapouzdřených polovodičových součástek ve vlhkém prostředí.
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.
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