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Released: 01.04.2014
CSN EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
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English Hardcopy
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| Number of Standard: | CSN EN 62047-18 |
| Category: | 358775 |
| Pages: | 24 |
| Released: | 01.04.2014 |
| Catalog number: | 95059 |
DESCRIPTION
CSN EN 62047-18
Original English text of CSN EN Standard.
The price of the Standard included all amendments and correcturs.