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in stockReleased: 2022-06
DIN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021
Halbleiterbauelemente - Richtlinien für Zuverlässigkeitsqualifizierungspläne - Teil 2: Konzept des Einsatzprofils (IEC 47/2718/CDV:2021); Deutsche und Englische Fassung prEN IEC 63287-2:2021
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English PDF
Immediate download
110.48 USD
English Hardcopy
In stock
110.48 USD
German PDF
Immediate download
110.48 USD
German Hardcopy
In stock
110.48 USD
| Status: | Draft |
| Released: | 2022-06 |
| Standard number: | DIN EN IEC 63287-2 |
| Name: | Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 47/2718/CDV:2021); German and English version prEN IEC 63287-2:2021 |
| Pages: | 29 |
DESCRIPTION