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Homepage>IEEE Standards>31 ELECTRONICS>31.180 Printed circuits and boards>IEEE 1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
Released: 09.08.2012

IEEE 1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components

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Withdraw:30.03.2023
Standard number:IEEE 1149.8.1-2012
Released:09.08.2012
ISBN:978-0-7381-7392-4
Pages:95
Status:Active
Language:English
DESCRIPTION

IEEE 1149.8.1-2012

This standard specifies extensions to IEEE Std 1149.1(TM) that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.1 Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.

The purpose of this standard is to codify testability circuitry added to an IC incremental to the testability provisions specified by IEEE Std 1149.1. This will enable selective ac stimulus generation that, when combined with non-contact signal sensing, allows testing signal paths between devices adhering to this standard and passive and/or active components.

New IEEE Standard - Inactive-Reserved. Extensions to IEEE Std 1149.1™ that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components are specified. Such networks are not adequately addressed by existing standards, including those networks that are ac-coupled or differential. The selective ac stimulus generation enabled by this standard, when combined with non-contact signal sensing, will allow testing of the connections between devices adhering to this standard and circuit elements such as series components, sockets, connectors, and integrated circuits (ICs) that do not implement IEEE Std 1149.1. This standard also specifies Boundary-Scan Description Language (BSDL) extensions to IEEE Std 1149.1 required to describe and support the new structures and methods.