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IEEE 1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Released: 13.05.2013
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463.13 USD
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488.28 USD
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344.20 USD
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IEEE 1149.1-1990 - IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard Test Access Port and Boundary-Scan Architecture
Released: 21.05.1990
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183.65 USD
IEEE 1532-2000 - IEEE Standard for In-System Configuration of Programmable Devices
IEEE Standard for In-System Configuration of Programmable Devices
IEEE Standard for In-System Configuration of Programmable Devices
Released: 12.01.2000
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161.01 USD
IEEE 1149.4-2024 - IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
Released: 06.12.2024
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137.22 USD
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153.46 USD
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125.79 USD
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114.35 USD
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153.46 USD
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IEEE 1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
IEEE Standard for a Mixed-Signal Test Bus
Released: 20.03.2000
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164.79 USD
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IEEE 1149.1-2001 - IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
Released: 23.07.2001
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192.46 USD
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337.12 USD
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336.20 USD
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