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Homepage>IEEE Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>IEEE 1241-2000 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
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Released: 22.06.2001

IEEE 1241-2000 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

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Standard number:IEEE 1241-2000
Released:22.06.2001
ISBN:978-0-7381-2725-5
Pages:98
Status:Active
Language:English
DESCRIPTION

IEEE 1241-2000

Analog to Digital converters, with or without sample and hold circuitry. 21-Sep-2000 Disapproved because the Sponsor must conduct a recirculation ballot to address substantive changes made to the document subsequent to balloting. The Sponsor is urged to complete coordination with IEC and editorial staff prior to conducting the recirculation ballot. The Sponsor shall also re-examine whether the document was written in accordance with the title and scope of the approved PAR (particularly 'standard' versus 'guide').

To provide standard terminology for specifying the performance of A/D converters, and to provide test methods for measuring the performance. The standard will be for general purpose applications and will not focus on highly specialized applications such as video recording.

New IEEE Standard - Superseded. IEEE Std 1241-2000 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.