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IEEE 1149.1-2001 - IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
Released: 23.07.2001
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181.77 USD
IEEE 1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Released: 13.05.2013
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437.40 USD
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325.08 USD
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389.88 USD
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117.61 USD
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144.93 USD
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215.03 USD
IEEE 1241-2000 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
Released: 22.06.2001
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173.44 USD
IEEE 1241-2023 - IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
Released: 06.10.2023
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163.08 USD
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203.04 USD
IEEE 1481-2009 - IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
Released: 11.03.2010
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358.78 USD
IEEE 1481-2019 - IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
Released: 13.03.2020
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552.42 USD
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408.67 USD
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510.84 USD
IEEE 1500-2005 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
Released: 29.08.2005
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178.20 USD
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178.20 USD
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223.34 USD
IEEE 1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
Released: 12.10.2022
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168.48 USD
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209.52 USD
IEEE 1581-2011 - IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
Released: 20.06.2011
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122.37 USD
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122.37 USD
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148.50 USD
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424.11 USD