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Homepage>IEEE Standards>29 ELECTRICAL ENGINEERING>29.120 Electrical accessories>29.120.50 Fuses and other overcurrent protection devices>IEEE C62.32-2004 - IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)
Released: 11.05.2005

IEEE C62.32-2004 - IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)

IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)

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Withdraw:09.01.2010
Standard number:IEEE C62.32-2004
Released:11.05.2005
ISBN:978-0-7381-0939-8
Pages:15
Status:Inactive
Language:English
DESCRIPTION

IEEE C62.32-2004

1.1 This standard applies to air gaps for over-voltage protection applications on systems with operating voltages equal to or less than 600 V rms. These protective devices are designed for limiting the voltages on balanced or unbalanced communication and signaling circuits. Specifically excluded from this standard are valve and expulsion type devices covered by ANSI/IEEE C62.1-1989, Standard for Surge Arresters for Alternating-Current Power Circuits. This standard contains a series of standard tests for determining the electrical characteristics of these air gap devices. 1.2 The tests in this standards are intended as design tests as defined in ANSI/IEEE Std 100-1996, Standard Dictionary of Electrical and Electronic Terms, and provide a means of comparison among various air gap surge protective devices. For those parameters affected by the interaction of the arrester with its associated mounting arrangement, some tests are necessarily applicable to the protector.1 1.3 Air gap devices are used to provide over-voltage protection in electrical circuits. When the device's breakdown voltage is exceeded, its normal high impedance state changes to a low impedance state to allow conduction of the surge discharge current. After the device conducts the surge discharge current, it interrupts the flow of system follow current and returns to its high impedance state. I the event of continuing current not representing normal system conditions, the device continues to provide a low impedance pass until an external bypass mechanism activates, the source of undesired current is de-energized, or a coordinated protective current element operates. This standard's test criteria and definitions provide a common engineering language beneficial to user and manufacturer of air gap surge protective devices. 1.4 Due to the voltage and energy levels employed in the majority of tests contained herein , all measurements should be considered dangerous and appropriate caution should be taken in their performance.

The original document does not have a Section "Purpose", the purpose of the document is included in the scope section. The purpose for the revision is to integrate comments made by members of the balloting group during the reaffirmation ballot in 1997. These changes will be limited to some editorial corrections and one technical change from1000V/s to 2000V/s in the foot note of paragraph 4.6 "DC Breakdown Voltage Test". Additionally it is the purpose to harmonize with relevant IEC documents and change the title from "Standard test Specification" to "Standard Test Method" and add the word "Components" after Surge-Protective Devices to read: IEEE Standard Test Methods for Low-Voltage Air Gap Surge-Protective Device Components (Excluding Valve and Expulsion Types)

Revision Standard - Inactive-Withdrawn. This standard applies to air gaps for overvoltage protection applications on systems with operating voltages equal to or less than 600 V rms. This standard contains a series of standard tests for determining the electrical characteristics of these air gap devices. This standard’s test criteria and definitions provide a common engineering language beneficial to users and manufacturers of air gap surge protective devices.