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Released: 30.12.2015
IEEE/IEC 63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
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| Standard number: | IEEE/IEC 63003-2015 |
| Released: | 30.12.2015 |
| ISBN: | 978-1-5044-0580-5 |
| Pages: | 175 |
| Status: | Active |
| Language: | English |
DESCRIPTION
IEEE/IEC 63003-2015
The scope of this standard is the definition of a pin map utilizing the IEEE 1505(TM) 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
Adoption Standard - Active. This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).