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Homepage>IEEE Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics

31.200 Integrated circuits. Microelectronics

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34 results
First page13
IEEE/IEC 62528-2007 - IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
Released: 09.12.2007
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361.39 EUR
IEEE 1149.10-2017 - IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
Released: 28.07.2017
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105.85 EUR
English Hardcopy
In stock
130.44 EUR
IEEE 1603-2003 - IEEE Standard for an Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
IEEE Standard for an Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
Released: 20.02.2004
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381.70 EUR
IEEE 605a-2010 - IEEE Guide for Bus Design in Air-Insulated Substations—Amendment 1
IEEE Guide for Bus Design in Air-Insulated Substations—Amendment 1
Released: 14.05.2010
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76.98 EUR
IEEE 1658-2023 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Released: 10.12.2024
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114.70 EUR
English Hardcopy
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143.86 EUR
IEEE 1687-2014 - IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
Released: 05.12.2014
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286.55 EUR
English PDF
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285.77 EUR
English Hardcopy
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359.25 EUR
IEEE 1658-2011 - IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Released: 10.02.2012
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177.49 EUR
English PDF
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177.49 EUR
IEEE/IEC 62265-2005 - IEC/IEEE International Standard - Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
IEC/IEEE International Standard - Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
Released: 20.02.2004
English PDF
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381.70 EUR
IEEE 1149.1-2001 - IEEE Standard Test Access Port and Boundary Scan Architecture
IEEE Standard Test Access Port and Boundary Scan Architecture
Released: 23.07.2001
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163.59 EUR
IEEE 605-1998 - IEEE Guide for the Design of Substation Rigid-Bus Structures
IEEE Guide for the Design of Substation Rigid-Bus Structures
Released: 09.04.1999
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184.97 EUR
34 results
First page13